Sponsors

Cypress Semiconductor Corporation

Sponsored Projects

  • Automatic Toothpaste Dispenser (Spring 2019)
  • Automatic Toothpaste Dispenser (Spring 2019)
  • Smart Electric Toothpaste Dispenser (Spring 2019)
  • Smart Electric Toothpaste Dispenser (Spring 2019)

Illinois Robotics in Space

Illinois Robotics in Space (IRIS) is an RSO at the University of Illinois at Urbana-Champaign. Every year IRIS competes in the NASA Robotic Mining Competition at Kennedy Space Center, works on smaller robotics-related projects and teaches younger students at local schools about what IRIS does.

Sponsored Projects

  • IRIS Localization System (Spring 2015)
  • IRIS Localization System (Spring 2015)

Illinois Tool Works Inc.

Sponsored Projects

  • Weld Gun Spatial Tracking System (Spring 2019)
  • Weld Gun Spatial Tracking System (Spring 2019)

Micron

Sponsored Projects

  • Soccer Team Gameplay Metrics (Spring 2019)
  • Soccer Team Gameplay Metrics (Spring 2019)
  • Traffic Sensing Bicycle Light (Spring 2019)
  • Traffic Sensing Bicycle Light (Spring 2019)

PowerBox Technology

Sponsored Projects

  • PowerBox Technology Power Meter (Fall 2024)

Siebel Center for Design

Sponsored Projects

  • Reconnaissance robot (SCD pitch) (Spring 2019)
  • Reconnaissance robot (SCD pitch) (Spring 2019)

Illini Solar Car

Sponsor

While Illini Solar Car started as a handful of engineering students in 2014, it takes more than that to create a solar car. Today we have grown into a much larger operation harnessing the skills of students from four colleges at Illinois to create one beautiful product.

Sponsored Projects

  • CUSTOM MPPTS FOR ILLINI SOLAR CAR (Spring 2024)
  • Active Cell Balancing for Solar Vehicle Battery Pack (Spring 2021)
  • Modules for Safe Power Distribution in an Electric Vehicle (Spring 2019)
  • Modules for Safe Power Distribution in an Electric Vehicle (Spring 2019)
  • Standalone Steering Wheel for Solar Racing Vehicle (Spring 2019)
  • Standalone Steering Wheel for Solar Racing Vehicle (Spring 2019)
  • Integrated Li-ion Battery Sensors (Fall 2018)
  • Integrated Li-ion Battery Sensors (Fall 2018)

LASSI

Sponsor

Laboratory for Advanced Space Systems at Illinois

Sponsored Projects

  • Power Board for Illini-Sat3 (Spring 2019)
  • Power Board for Illini-Sat3 (Spring 2019)

Lextech

Sponsor

Northrop Grumman Corporation

Sponsor

Northrop Grumman Corporation has provided funding for laboratory equipment and supplies in the area of applied electromagnetics, as well as support for the following groups.

Sponsored Projects

  • Filtered Back – Projection Optical Demonstration (Fall 2014)
  • Filtered Back – Projection Optical Demonstration (Fall 2014)
  • Wearable UV Radiation Sensing Device (Fall 2014)
  • Wearable UV Radiation Sensing Device (Fall 2014)
  • Radio Jammer (Fall 2005)
  • Radio Jammer (Fall 2005)

Advance Devices

Supporter

ARM

Supporter

Boeing

Supporter

Intel

Supporter

Raytheon

Supporter

Rockwell Collins

Supporter

Rockwell Collins has provided funding for laboratory equipment and supplies in the area of applied electromagnetics. A number of RF student projects have directly benefited from these improvements to the laboratory.

Sponsored Projects

  • Quadcopter - Sense and Avoid - Revised RFA (Fall 2014)
  • Quadcopter - Sense and Avoid - Revised RFA (Fall 2014)
  • Continuous-frequency Synthesizer (Spring 2005)
  • Continuous-frequency Synthesizer (Spring 2005)
  • football position tracker (Spring 2005)
  • football position tracker (Spring 2005)
  • Point-to-Point RF Communication for Wildlife Project (Spring 2005)
  • Point-to-Point RF Communication for Wildlife Project (Spring 2005)
  • RFID-based parking meter system (Spring 2005)
  • RFID-based parking meter system (Spring 2005)
  • Smart Inventory Management System (SIMS) Using RFID (Spring 2005)
  • Smart Inventory Management System (SIMS) Using RFID (Spring 2005)
  • Wireless Laptop Alarm (Spring 2005)
  • Wireless Laptop Alarm (Spring 2005)
  • Car rooftop antenna (Fall 2004)
  • Car rooftop antenna (Fall 2004)
  • Portable Wireless Locator System (Fall 2004)
  • Portable Wireless Locator System (Fall 2004)
  • Transmission line modeling in SPICE (Fall 2004)
  • Transmission line modeling in SPICE (Fall 2004)
  • Wireless Heart Attack Detector with GPS (Fall 2004)
  • Wireless Heart Attack Detector with GPS (Fall 2004)
  • Wireless switch of household appliances for handicapped (Fall 2004)
  • Wireless switch of household appliances for handicapped (Fall 2004)

Skot Wiedmann

Supporter

Sponsored Projects

  • Interactive Proximity Donor Wall Illumination (Fall 2018)
  • Interactive Proximity Donor Wall Illumination (Fall 2018)
  • Modular Analog Synthesizer (Fall 2017)
  • Modular Analog Synthesizer (Fall 2017)
  • AUDIO - ANALOG/DIGITAL SYNTHESIZER - ANALOG VOLTAGE CONTROLLED OSCILLATOR TO DIGITALLY CONTROLLED STEP-SEQUENCER (Spring 2017)
  • AUDIO - ANALOG/DIGITAL SYNTHESIZER - ANALOG VOLTAGE CONTROLLED OSCILLATOR TO DIGITALLY CONTROLLED STEP-SEQUENCER (Spring 2017)

TAKE Solutions

Supporter

Funded Project 39 (smart door) Spring 2015

Texas Instruments

Supporter

Texas Instruments has donated laboratory equipment for DSP and RFID based projects. A number of student projects have directly benefited from these improvements to the laboratory.

Sponsored Projects

  • Miner Tracking Devices (Spring 2006)
  • Miner Tracking Devices (Spring 2006)
  • Quantum Cryptography Project 1 (Spring 2006)
  • Quantum Cryptography Project 1 (Spring 2006)

Xilinx

Supporter

Four Point Probe

Simon Danthinne, Ming-Yan Hsiao, Dorian Tricaud

Four Point Probe

Featured Project

# Four Point Probe

Team Members:

Simon Danthinne(simoned2)

Ming-Yan Hsiao(myhsiao2)

Dorian Tricaud (tricaud2)

# Problem:

In the manufacturing process of semiconductor wafers, numerous pieces of test equipment are essential to verify that each manufacturing step has been correctly executed. This requirement significantly raises the cost barrier for entering semiconductor manufacturing, making it challenging for students and hobbyists to gain practical experience. To address this issue, we propose developing an all-in-one four-point probe setup. This device will enable users to measure the surface resistivity of a wafer, a critical parameter that can provide insights into various properties of the wafer, such as its doping level. By offering a more accessible and cost-effective solution, we aim to lower the entry barriers and facilitate hands-on learning and experimentation in semiconductor manufacturing.

# Solution:

Our design will use an off-the-shelf four point probe head for the precision manufacturing tolerances which will be used for contact with the wafer. This wafer contact solution will then be connected to a current source precisely controlled by an IC as well as an ADC to measure the voltage. For user interface, we will have an array of buttons for user input as well as an LCD screen to provide measurement readout and parameter setup regarding wafer information. This will allow us to make better approximations for the wafer based on size and doping type.

# Solution Components:

## Subsystem 1: Measurement system

We will utilize a four-point probe head (HPS2523) with 2mm diameter gold tips to measure the sheet resistance of the silicon wafer. A DC voltage regulator (DIO6905CSH3) will be employed to force current through the two outer tips, while a 24-bit ADC (MCP3561RT-E/ST) will measure the voltage across the two inner tips, with expected measurements in the millivolt range and current operation lasting several milliseconds. Additionally, we plan to use an AC voltage regulator (TPS79633QDCQRQ1) to transiently sweep the outer tips to measure capacitances between them, which will help determine the dopants present. To accurately measure the low voltages, we will amplify the signal using an JFET op-amp (OPA140AIDGKR) to ensure it falls within the ADC’s specifications. Using these measurements, we can apply formulas with corrections for real-world factors to calculate the sheet resistance and other parameters of the wafer.

## Subsystem 2: User Input

To enable users to interact effectively with the measurement system, we will implement an array of buttons that offer various functions such as calibration, measurement setup, and measurement polling. This interface will let users configure the measurement system to ensure that the approximations are suitable for the specific properties of the wafer. The button interface will provide users with the ability to initiate calibration routines to ensure accuracy and reliability, and set up measurements by defining parameters like type, range, and size tailored to the wafer’s characteristics. Additionally, users can poll measurements to start, stop, and monitor ongoing measurements, allowing for real-time adjustments and data collection. The interface also allows users to make approximations regarding other wafer properties so the user can quickly find out more information on their wafer. This comprehensive button interface will make the measurement system user-friendly and adaptable, ensuring precise and efficient measurements tailored to the specific needs of each wafer.

## Subsystem 3: Display

To provide output to users, we will utilize a monochrome 2.4 inch 128x64 OLED LCD display driven over SPI from the MCU. This display will not only present data clearly but also serve as an interface for users to interact with the device. The monochrome LCD will be instrumental in displaying measurement results, system status, and other relevant information in a straightforward and easy-to-read format. Additionally, it will facilitate user interaction by providing visual feedback during calibration, measurement setup, and polling processes. This ensures that users can efficiently navigate and operate the device, making the overall experience intuitive and user-friendly.

# Criterion for Success:

A precise constant current can be run through the wafer for various samples

Measurement system can identify voltage (10mV range minimum) across wafer

Measurement data and calculations can be viewed on LCD

Button inputs allow us to navigate and setup measurement parameters

Total part cost per unit must be less than cheapest readily available four point probes (≤ 650 USD)

Project Videos