Course Overview

Welcome!

Welcome to ECE 445! If you've looked at the course Calendar, you've probably already noticed that this class is quite different from most other classes in the department. The class only meets as a whole for the first few weeks of the semester. During these lectures you will meet the Course Staff, learn about specific assignments, requirements, and resources for the course, and have a chance to meet other students to share ideas and form teams. These are some of the most important weeks for the class since the decisions you make during this time will determine what you'll get out of this class and, in many ways, how much you'll enjoy it.

Outside of lecture, you are expected to be working on your own to develop ideas and form teams. You are also expected to actively participate on the web board to exchange ideas, receive feedback from course staff, and eventually get your project idea approved. Once your team has a project approved, you will be assigned a TA, with whom you will have weekly meetings. Think of your TA as a project manager. Keep in mind that they are not there to do the work for you. Rather, they are there to keep you on track, point you towards resources (both within and outside of the department), and evaluate the result of your efforts.

Expectations and Requirements

We have high expectations for students participating in ECE 445. You are soon to be alumni of one of the top ECE departments of the world. Our alumni hold themselves to high technical and professional standards of conduct.

In general, projects are expected to solve an interesting problem within the constraints of the course. You will discuss the motivation for your project and its societal impact. What are the potential benefits and possible negative consequences of your project? What engineering standards are applicable?

Your projects are expected to be safe and ethical, and to satisfy applicable ethical codes developed by professional societies such as IEEE or ACM. Previous projects have covered a wide range of topics in areas of personal convenience, entertainment, medical research and treatment, personal transportation, music, robotics, and industrial processes, to name a few.

Projects are expected to have a level of design complexity commensurate with the rigor of the ECE Illinois curriculum. Requirements for specific assignments due throughout the semester can be found by looking through the Grading Scheme for the course. Please read through this documentation well before each assignment is due. Specific due dates can be found on the course Calendar.

Below are a few words of wisdom to keep in mind throughout the semester to increase your enjoyment and success in the course:

Four Point Probe

Simon Danthinne, Ming-Yan Hsiao, Dorian Tricaud

Four Point Probe

Featured Project

# Four Point Probe

Team Members:

Simon Danthinne(simoned2)

Ming-Yan Hsiao(myhsiao2)

Dorian Tricaud (tricaud2)

# Problem:

In the manufacturing process of semiconductor wafers, numerous pieces of test equipment are essential to verify that each manufacturing step has been correctly executed. This requirement significantly raises the cost barrier for entering semiconductor manufacturing, making it challenging for students and hobbyists to gain practical experience. To address this issue, we propose developing an all-in-one four-point probe setup. This device will enable users to measure the surface resistivity of a wafer, a critical parameter that can provide insights into various properties of the wafer, such as its doping level. By offering a more accessible and cost-effective solution, we aim to lower the entry barriers and facilitate hands-on learning and experimentation in semiconductor manufacturing.

# Solution:

Our design will use an off-the-shelf four point probe head for the precision manufacturing tolerances which will be used for contact with the wafer. This wafer contact solution will then be connected to a current source precisely controlled by an IC as well as an ADC to measure the voltage. For user interface, we will have an array of buttons for user input as well as an LCD screen to provide measurement readout and parameter setup regarding wafer information. This will allow us to make better approximations for the wafer based on size and doping type.

# Solution Components:

## Subsystem 1: Measurement system

We will utilize a four-point probe head (HPS2523) with 2mm diameter gold tips to measure the sheet resistance of the silicon wafer. A DC voltage regulator (DIO6905CSH3) will be employed to force current through the two outer tips, while a 24-bit ADC (MCP3561RT-E/ST) will measure the voltage across the two inner tips, with expected measurements in the millivolt range and current operation lasting several milliseconds. Additionally, we plan to use an AC voltage regulator (TPS79633QDCQRQ1) to transiently sweep the outer tips to measure capacitances between them, which will help determine the dopants present. To accurately measure the low voltages, we will amplify the signal using an JFET op-amp (OPA140AIDGKR) to ensure it falls within the ADC’s specifications. Using these measurements, we can apply formulas with corrections for real-world factors to calculate the sheet resistance and other parameters of the wafer.

## Subsystem 2: User Input

To enable users to interact effectively with the measurement system, we will implement an array of buttons that offer various functions such as calibration, measurement setup, and measurement polling. This interface will let users configure the measurement system to ensure that the approximations are suitable for the specific properties of the wafer. The button interface will provide users with the ability to initiate calibration routines to ensure accuracy and reliability, and set up measurements by defining parameters like type, range, and size tailored to the wafer’s characteristics. Additionally, users can poll measurements to start, stop, and monitor ongoing measurements, allowing for real-time adjustments and data collection. The interface also allows users to make approximations regarding other wafer properties so the user can quickly find out more information on their wafer. This comprehensive button interface will make the measurement system user-friendly and adaptable, ensuring precise and efficient measurements tailored to the specific needs of each wafer.

## Subsystem 3: Display

To provide output to users, we will utilize a monochrome 2.4 inch 128x64 OLED LCD display driven over SPI from the MCU. This display will not only present data clearly but also serve as an interface for users to interact with the device. The monochrome LCD will be instrumental in displaying measurement results, system status, and other relevant information in a straightforward and easy-to-read format. Additionally, it will facilitate user interaction by providing visual feedback during calibration, measurement setup, and polling processes. This ensures that users can efficiently navigate and operate the device, making the overall experience intuitive and user-friendly.

# Criterion for Success:

A precise constant current can be run through the wafer for various samples

Measurement system can identify voltage (10mV range minimum) across wafer

Measurement data and calculations can be viewed on LCD

Button inputs allow us to navigate and setup measurement parameters

Total part cost per unit must be less than cheapest readily available four point probes (≤ 650 USD)

Project Videos